Abstract
Preserving the data stored in a static random access memory (SRAM) during power gating or a sudden power outage is a necessary but costly need. This work proposes an ultraefficient auto-nonvolatile ternary SRAM (ATSRAM) cell using ferroelectric carbon nanotube field-effect transistors (Fe-CNTFETs). By harnessing the unique features in Fe-CNTFETs, the proposed ATSRAM utilizes only 12 transistors. The proposed design can automatically perform backup and restore operations without additional resources and nonvolatile elements during a power outage. This unique specification eliminates the redundancies usually required to provide nonvolatility. The utilized hysteretic cross-coupled two-transistor standard ternary inverters (STIs) provide a superior static noise margin (SNM) beyond the binary SRAMs and the ideal noise margin limitation ( ${V}_{\text {DD}}$ /4). The proposed ATSRAM array structure benefits from a row-shared supply disconnector to mitigate the static current drawn from the power supply during data retention. Our results demonstrate that the proposed ATSRAM indicates, on average, 40% improvement in transistor count, 2.8 times higher SNMs, 27% reduction in total power consumption, and 41% (66%) improvement in the read (write) energy compared with the state-of-the-art volatile ternary SRAMs. In a ${32} \times {32}$ ternary array configuration, 94% (98%) improvement in the read (write) energy is obtained compared with the other counterparts. Our design methodology provides a new paradigm for designing ultraefficient and ultracompact nonvolatile multivalued logic (MVL) memories using ferroelectric-based FETs.
| Original language | English |
|---|---|
| Pages (from-to) | 6113-6120 |
| Number of pages | 8 |
| Journal | IEEE Transactions on Electron Devices |
| Volume | 69 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 1 Nov 2022 |
| Externally published | Yes |
Bibliographical note
Publisher Copyright:© 1963-2012 IEEE.
Keywords
- Auto-nonvolatile
- ferroelectric carbon nanotube field-effect transistor (Fe-CNTFET)
- static noise margin (SNM)
- static random access memory (SRAM)
- ternary logic