A study of accelerated life test of white OLED based on maximum likelihood estimation using lognormal distribution

Jianping Zhang; Fang Liu; Yu Liu; Helen Wu; Wenli Wu; Aixi Zhou

doi:10.1109/TED.2012.2215864

A study of accelerated life test of white OLED based on maximum likelihood estimation using lognormal distribution

Jianping Zhang, Fang Liu, Yu Liu, Helen Wu, Wenli Wu, Aixi Zhou

Research output: Contribution to journal › Article › peer-review

25 Citations (Scopus)

Abstract

In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maximum likelihood estimation. The Kolmogorov–Smirnov test was performed, and the results further confirmed that WOLED life met the lognormal distribution. Numerical results indicated that WOLED life followed the lognormal distribution. It was also found that the acceleration model was consistent with inverse power law.

Original language	English
Pages (from-to)	3401-3404
Number of pages	4
Journal	IEEE Transactions on Electron Devices
Volume	59
Issue number	12
DOIs	https://doi.org/10.1109/TED.2012.2215864
Publication status	Published - 2012

Keywords

accelerated life testing
lognormal distribution
maximum likelihood estimation
diode
light emitting

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10.1109/TED.2012.2215864

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title = "A study of accelerated life test of white OLED based on maximum likelihood estimation using lognormal distribution",

abstract = "In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maximum likelihood estimation. The Kolmogorov–Smirnov test was performed, and the results further confirmed that WOLED life met the lognormal distribution. Numerical results indicated that WOLED life followed the lognormal distribution. It was also found that the acceleration model was consistent with inverse power law.",

keywords = "accelerated life testing, lognormal distribution, maximum likelihood estimation, diode, light emitting",

author = "Jianping Zhang and Fang Liu and Yu Liu and Helen Wu and Wenli Wu and Aixi Zhou",

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language = "English",

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T1 - A study of accelerated life test of white OLED based on maximum likelihood estimation using lognormal distribution

AU - Zhang, Jianping

AU - Liu, Fang

AU - Liu, Yu

AU - Wu, Helen

AU - Wu, Wenli

AU - Zhou, Aixi

PY - 2012

Y1 - 2012

N2 - In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maximum likelihood estimation. The Kolmogorov–Smirnov test was performed, and the results further confirmed that WOLED life met the lognormal distribution. Numerical results indicated that WOLED life followed the lognormal distribution. It was also found that the acceleration model was consistent with inverse power law.

AB - In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maximum likelihood estimation. The Kolmogorov–Smirnov test was performed, and the results further confirmed that WOLED life met the lognormal distribution. Numerical results indicated that WOLED life followed the lognormal distribution. It was also found that the acceleration model was consistent with inverse power law.

KW - accelerated life testing

KW - lognormal distribution

KW - maximum likelihood estimation

KW - diode

KW - light emitting

UR - http://handle.uws.edu.au:8081/1959.7/518220

U2 - 10.1109/TED.2012.2215864

DO - 10.1109/TED.2012.2215864

M3 - Article

SN - 0018-9383

VL - 59

SP - 3401

EP - 3404

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 12

ER -

A study of accelerated life test of white OLED based on maximum likelihood estimation using lognormal distribution

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Keywords

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