Constant-step-stress accelerated life test of white OLED under Weibull distribution case

JianPing Zhang; TingJun Zhou; Helen Wu; Yu Liu; WenLi Wu; JianXing Ren

doi:10.1109/TED.2011.2181175

Constant-step-stress accelerated life test of white OLED under Weibull distribution case

JianPing Zhang, TingJun Zhou, Helen Wu, Yu Liu, WenLi Wu, JianXing Ren

Research output: Contribution to journal › Article › peer-review

32 Citations (Scopus)

Abstract

In order to acquire the life information of the white organic light-emitting diode (OLED), Weibull distribution function was applied to describe the life distribution, whereas the least square method was employed to estimate the shape and scale parameters. The accelerated life equation was determined, and the statistics and analysis on constant-stress and step-stress test data were performed using the software developed by the authors. The numerical results indicate that Weibull distribution and the inverse power law are both consistent with the employed assumptions and that the accurately calculated acceleration parameters enable a rapid estimation of the white OLED life.

Original language	English
Pages (from-to)	715-720
Number of pages	6
Journal	IEEE Transactions on Electron Devices
Volume	59
Issue number	3
DOIs	https://doi.org/10.1109/TED.2011.2181175
Publication status	Published - 2012

Keywords

light emitting diodes
least squares
Weibull distribution

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10.1109/TED.2011.2181175

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title = "Constant-step-stress accelerated life test of white OLED under Weibull distribution case",

abstract = "In order to acquire the life information of the white organic light-emitting diode (OLED), Weibull distribution function was applied to describe the life distribution, whereas the least square method was employed to estimate the shape and scale parameters. The accelerated life equation was determined, and the statistics and analysis on constant-stress and step-stress test data were performed using the software developed by the authors. The numerical results indicate that Weibull distribution and the inverse power law are both consistent with the employed assumptions and that the accurately calculated acceleration parameters enable a rapid estimation of the white OLED life.",

keywords = "light emitting diodes, least squares, Weibull distribution",

author = "JianPing Zhang and TingJun Zhou and Helen Wu and Yu Liu and WenLi Wu and JianXing Ren",

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T1 - Constant-step-stress accelerated life test of white OLED under Weibull distribution case

AU - Zhang, JianPing

AU - Zhou, TingJun

AU - Wu, Helen

AU - Liu, Yu

AU - Wu, WenLi

AU - Ren, JianXing

PY - 2012

Y1 - 2012

N2 - In order to acquire the life information of the white organic light-emitting diode (OLED), Weibull distribution function was applied to describe the life distribution, whereas the least square method was employed to estimate the shape and scale parameters. The accelerated life equation was determined, and the statistics and analysis on constant-stress and step-stress test data were performed using the software developed by the authors. The numerical results indicate that Weibull distribution and the inverse power law are both consistent with the employed assumptions and that the accurately calculated acceleration parameters enable a rapid estimation of the white OLED life.

AB - In order to acquire the life information of the white organic light-emitting diode (OLED), Weibull distribution function was applied to describe the life distribution, whereas the least square method was employed to estimate the shape and scale parameters. The accelerated life equation was determined, and the statistics and analysis on constant-stress and step-stress test data were performed using the software developed by the authors. The numerical results indicate that Weibull distribution and the inverse power law are both consistent with the employed assumptions and that the accurately calculated acceleration parameters enable a rapid estimation of the white OLED life.

KW - light emitting diodes

KW - least squares

KW - Weibull distribution

UR - http://handle.uws.edu.au:8081/1959.7/516876

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DO - 10.1109/TED.2011.2181175

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EP - 720

JO - IEEE Transactions on Electron Devices

JF - IEEE Transactions on Electron Devices

IS - 3

ER -

Constant-step-stress accelerated life test of white OLED under Weibull distribution case

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Keywords

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