Constant-step-stress accelerated life test of white OLED under Weibull distribution case

In order to acquire the life information of the white organic light-emitting diode (OLED), Weibull distribution function was applied to describe the life distribution, whereas the least square method was employed to estimate the shape and scale parameters. The accelerated life equation was determined, and the statistics and analysis on constant-stress and step-stress test data were performed using the software developed by the authors. The numerical results indicate that Weibull distribution and the inverse power law are both consistent with the employed assumptions and that the accurately calculated acceleration parameters enable a rapid estimation of the white OLED life.