Abstract
As everyone in the EM community is well aware, modern electron microscopes (TEM, SEM and FIB systems) require stable environments in order to make them capable of extremely high-resolution performance. Further to this, in many cases, there are a whole range of diverse instrumentation housed with or near the EM microscopes. Multipurpose laboratories and facilities require specialised building design and construction considerations that must work seamlessly with other infrastructure. This is not always a simple process [1, 2].
Original language | English |
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Pages (from-to) | 1943-1946 |
Number of pages | 4 |
Journal | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada |
Volume | 30 |
DOIs | |
Publication status | Published - 24 Jul 2024 |
Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024 |