Determination of niobium diffusion in titania and zirconia using secondary ion mass spectrometry

L. R. Sheppard, M. F. Zhou, A. Atanacio, T. Bak, Janusz Nowotny, K. E. Prince

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

This paper provides an outline for the use of secondary ion mass spectrometry (SIMS) in the determination of diffusion data in metal oxides. The focus is on the determination of Nb bulk and grain boundary diffusion coefficients in TiO2 and zirconia. Specifically, the diffusion of Nb in TiO2 and yttria doped (10 mol.-%) ZrO2 (10YSZ) has been assessed. The following bulk diffusion coefficients D93Nb were obtained D93Nb=(1.03±0.051) × 10-18 m2 s-1 10YSZ(1273K) D93Nb=(1.91±0.096) × 10-16 m2 s-1 TiO2(1273K) The grain boundary diffusion parameter for Nb grain boundary diffusion in 10YSZ was also determined D93Nbδα=(7.48±0.37) × 10-25 m2 s-1 10YSZ(1273K) The Nb grain boundary diffusion coefficient D′93Nb was determined to be D′93Nb=(3.99±0.20) × 10-16 m2 s-1 10YSZ(1273K).

Original languageEnglish
Pages (from-to)89-94
Number of pages6
JournalAdvances in Applied Ceramics
Volume106
Issue number1-2
DOIs
Publication statusPublished - Feb 2007
Externally publishedYes

Keywords

  • Bulk diffusion
  • Grain boundary diffusion
  • Niobium
  • Secondary ion mass spectrometry
  • Titania
  • Zirconia

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