Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults

S. Vongpradhip; A. Ginige

doi:10.1109/ASIC.1993.410808

Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults

S. Vongpradhip, A. Ginige

University of Technology Sydney

Research output: Chapter in Book / Conference Paper › Conference Paper › peer-review

1 Citation (Scopus)

Abstract

A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model.

Original language	English
Title of host publication	Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	65-68
Number of pages	4
ISBN (Electronic)	0780313755, 9780780313750
DOIs	https://doi.org/10.1109/ASIC.1993.410808
Publication status	Published - 1993
Externally published	Yes
Event	6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993 - Rochester, United States Duration: 27 Sept 1993 → 1 Oct 1993

Publication series

Name	Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993

Conference

Conference	6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993
Country/Territory	United States
City	Rochester
Period	27/09/93 → 1/10/93

Bibliographical note

Publisher Copyright:
© 1993 IEEE.

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10.1109/ASIC.1993.410808

Cite this

Vongpradhip, S., & Ginige, A. (1993). Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults. In Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993 (pp. 65-68). Article 410808 (Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ASIC.1993.410808

Vongpradhip, S. ; Ginige, A. / Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults. Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993. Institute of Electrical and Electronics Engineers Inc., 1993. pp. 65-68 (Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993).

@inproceedings{9e72b9b34d0040e8865b394d6ec9fad0,

title = "Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults",

abstract = "A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model.",

author = "S. Vongpradhip and A. Ginige",

note = "Publisher Copyright: {\textcopyright} 1993 IEEE.; 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993 ; Conference date: 27-09-1993 Through 01-10-1993",

year = "1993",

doi = "10.1109/ASIC.1993.410808",

language = "English",

series = "Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "65--68",

booktitle = "Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993",

}

Vongpradhip, S & Ginige, A 1993, Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults. in Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993., 410808, Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993, Institute of Electrical and Electronics Engineers Inc., pp. 65-68, 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993, Rochester, United States, 27/09/93. https://doi.org/10.1109/ASIC.1993.410808

Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults. / Vongpradhip, S.; Ginige, A.
Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993. Institute of Electrical and Electronics Engineers Inc., 1993. p. 65-68 410808 (Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993).

Research output: Chapter in Book / Conference Paper › Conference Paper › peer-review

TY - GEN

T1 - Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults

AU - Vongpradhip, S.

AU - Ginige, A.

PY - 1993

Y1 - 1993

N2 - A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model.

AB - A basis (framework) for comparing different testability measures was developed. Using this method testability values obtained for a set of ISCAS85 benchmark circuits using STAFAN and SCOAP techniques were compared. Also the authors extended the statistical testability analysis technique to cover transient (delay) faults and compared the results with values from a probabilistic technique. They observed that the values from their technique generally agree with the values from the probabilistic model.

UR - http://www.scopus.com/inward/record.url?scp=1842761956&partnerID=8YFLogxK

U2 - 10.1109/ASIC.1993.410808

DO - 10.1109/ASIC.1993.410808

M3 - Conference Paper

AN - SCOPUS:1842761956

T3 - Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993

SP - 65

EP - 68

BT - Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993

Y2 - 27 September 1993 through 1 October 1993

ER -

Vongpradhip S, Ginige A. Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults. In Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993. Institute of Electrical and Electronics Engineers Inc. 1993. p. 65-68. 410808. (Proceedings - 6th Annual IEEE International ASIC Conference and Exhibit, ASIC 1993). doi: 10.1109/ASIC.1993.410808

Direct comparison of 2 set of results from testability analysis by using correlation and statistical testability analysis of transient (delay) faults

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