Abstract
The present work determined the effect of chromium segregation on surface and near-surface composition of Cr-doped TiO2 (0.05 at.% Cr) after annealing in oxidising and strongly reducing environments at 1,073 and 1,273 K. The segregation-induced depth profiles were determined by secondary ion mass spectrometry (SIMS). It was observed that annealing in oxidising conditions [p(O2)"‰="‰105 Pa] and reducing conditions [10−11 Pa"‰>"‰p(O2)"‰>"‰10−15 Pa] results in an enrichment and depletion of the surface layer in chromium, respectively. The observed effects may be used for tailoring the surface and near-surface composition in order to impose desired properties.
| Original language | English |
|---|---|
| Pages (from-to) | 785-790 |
| Number of pages | 6 |
| Journal | Ionics |
| Volume | 21 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2015 |