TY - JOUR
T1 - Electron backscatter diffraction characterization of plasma immersion ion implantation effects in stainless steel
AU - Davis, Joel
AU - Short, Ken
AU - Wuhrer, Richard
AU - Phillips, Matthew R.
AU - Lumpkin, Gregory R.
AU - Whittle, Karl R.
PY - 2013
Y1 - 2013
N2 - In these experiments plasma immersion ion implantation is utilised to simulate some of the radiation effects in a nuclear reactor environment. Scanning electron microscopy using the angular selective backscatter detector has revealed observable changes in crystallographic contrast after irradiation with helium ions. Further studies using electron backscatter diffraction in both plan and cross section view allow us to visualize the extent and depth of damage and observe differences in the behavior of different crystalline phases present in several grades of stainless steel.
AB - In these experiments plasma immersion ion implantation is utilised to simulate some of the radiation effects in a nuclear reactor environment. Scanning electron microscopy using the angular selective backscatter detector has revealed observable changes in crystallographic contrast after irradiation with helium ions. Further studies using electron backscatter diffraction in both plan and cross section view allow us to visualize the extent and depth of damage and observe differences in the behavior of different crystalline phases present in several grades of stainless steel.
UR - http://handle.uws.edu.au:8081/1959.7/530248
U2 - 10.1016/j.nimb.2012.10.007
DO - 10.1016/j.nimb.2012.10.007
M3 - Article
SN - 0168-583X
VL - 295
SP - 38
EP - 41
JO - Nuclear Instruments and Methods in Physics Research. Section B
JF - Nuclear Instruments and Methods in Physics Research. Section B
ER -