Electronically programmable test points for on-chip analog/digital measurements

M. Franco, J. Guiza, E. Chiappetta, S. Rueda, H. Luis, J. Bertuzzo, J. Koeppe, T. Robins, J. Jenkins, T. Hamilton

Research output: Chapter in Book / Conference PaperConference Paperpeer-review

1 Citation (Scopus)

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