Isogeometric analysis of bending, vibration, and buckling behaviors of multilayered microplates based on the non-classical refined shear deformation theory

This paper presents a non-classical refined shear deformation theory model in conjunction with the isogeometric analysis for the static bending, free vibration, and buckling behaviors of multilayered microplates. The modified couple stress theory is used to account for the small-scale effect. Taking a five-layer (Al, P3HT: PCBM, PEDOT: PSS, ITO, and Glass) organic solar cell as an example, it is found that the small-scale effects lead to a decrease in deflection, but an increase in the natural frequency and buckling load. With consideration of the size effect (l/h = 1), the stresses are almost 5 times as much as that without the size effect (l/h = 0). This is why the size effect should be taken into account. Besides, the maximum tensile stress occurs in the ITO layer, which is the dangerous layer. In addition, the normalized deflections increase with increasing aspect ratio, but the normalized natural frequencies and normalized buckling loads decrease with increasing aspect ratio.