Life prediction for white OLED based on LSM under lognormal distribution

Jianping Zhang; Fang Liu; Yu Liu; Helen Wu; Wenqing Zhu; Wenli Wu; Liang Wu

doi:10.1016/j.sse.2011.12.004

Life prediction for white OLED based on LSM under lognormal distribution

Jianping Zhang, Fang Liu, Yu Liu, Helen Wu, Wenqing Zhu, Wenli Wu, Liang Wu

Research output: Contribution to journal › Article › peer-review

27 Citations (Scopus)

Abstract

In order to acquire the reliability information of White Organic Light Emitting Display (OLED), three groups of OLED constant stress accelerated life tests (CSALTs) were carried out to obtain failure data of samples. Lognormal distribution function was applied to describe OLED life distribution, and the accelerated life equation was determined by Least square method (LSM). The Kolmogorov-Smirnov test was performed to verify whether the white OLED life meets lognormal distribution or not. Author-developed software was employed to predict the average life and the median life. The numerical results indicate that the white OLED life submits to lognormal distribution, and that the accelerated life equation meets inverse power law completely. The estimated life information of the white OLED provides manufacturers and customers with important guidelines.

Original language	English
Pages (from-to)	102-106
Number of pages	5
Journal	Solid-State Electronics
Volume	75
DOIs	https://doi.org/10.1016/j.sse.2011.12.004
Publication status	Published - 2012

Keywords

accelerated life testing
least squares
white organic light-emitting diodes
life prediction

Access to Document

10.1016/j.sse.2011.12.004

Cite this

@article{f51623def7714acc9bbdeef6b6d2fcab,

title = "Life prediction for white OLED based on LSM under lognormal distribution",

abstract = "In order to acquire the reliability information of White Organic Light Emitting Display (OLED), three groups of OLED constant stress accelerated life tests (CSALTs) were carried out to obtain failure data of samples. Lognormal distribution function was applied to describe OLED life distribution, and the accelerated life equation was determined by Least square method (LSM). The Kolmogorov-Smirnov test was performed to verify whether the white OLED life meets lognormal distribution or not. Author-developed software was employed to predict the average life and the median life. The numerical results indicate that the white OLED life submits to lognormal distribution, and that the accelerated life equation meets inverse power law completely. The estimated life information of the white OLED provides manufacturers and customers with important guidelines.",

keywords = "accelerated life testing, least squares, white organic light-emitting diodes, life prediction",

author = "Jianping Zhang and Fang Liu and Yu Liu and Helen Wu and Wenqing Zhu and Wenli Wu and Liang Wu",

year = "2012",

doi = "10.1016/j.sse.2011.12.004",

language = "English",

volume = "75",

pages = "102--106",

journal = "Solid-State Electronics",

issn = "0038-1101",

publisher = "Elsevier",

}

TY - JOUR

T1 - Life prediction for white OLED based on LSM under lognormal distribution

AU - Zhang, Jianping

AU - Liu, Fang

AU - Liu, Yu

AU - Wu, Helen

AU - Zhu, Wenqing

AU - Wu, Wenli

AU - Wu, Liang

PY - 2012

Y1 - 2012

N2 - In order to acquire the reliability information of White Organic Light Emitting Display (OLED), three groups of OLED constant stress accelerated life tests (CSALTs) were carried out to obtain failure data of samples. Lognormal distribution function was applied to describe OLED life distribution, and the accelerated life equation was determined by Least square method (LSM). The Kolmogorov-Smirnov test was performed to verify whether the white OLED life meets lognormal distribution or not. Author-developed software was employed to predict the average life and the median life. The numerical results indicate that the white OLED life submits to lognormal distribution, and that the accelerated life equation meets inverse power law completely. The estimated life information of the white OLED provides manufacturers and customers with important guidelines.

AB - In order to acquire the reliability information of White Organic Light Emitting Display (OLED), three groups of OLED constant stress accelerated life tests (CSALTs) were carried out to obtain failure data of samples. Lognormal distribution function was applied to describe OLED life distribution, and the accelerated life equation was determined by Least square method (LSM). The Kolmogorov-Smirnov test was performed to verify whether the white OLED life meets lognormal distribution or not. Author-developed software was employed to predict the average life and the median life. The numerical results indicate that the white OLED life submits to lognormal distribution, and that the accelerated life equation meets inverse power law completely. The estimated life information of the white OLED provides manufacturers and customers with important guidelines.

KW - accelerated life testing

KW - least squares

KW - white organic light-emitting diodes

KW - life prediction

UR - http://handle.uws.edu.au:8081/1959.7/517462

U2 - 10.1016/j.sse.2011.12.004

DO - 10.1016/j.sse.2011.12.004

M3 - Article

SN - 0038-1101

VL - 75

SP - 102

EP - 106

JO - Solid-State Electronics

JF - Solid-State Electronics

ER -

Life prediction for white OLED based on LSM under lognormal distribution

Abstract

Keywords

Access to Document

Other files and links

Fingerprint

Cite this