Life prediction for white OLED based on LSM under lognormal distribution

In order to acquire the reliability information of White Organic Light Emitting Display (OLED), three groups of OLED constant stress accelerated life tests (CSALTs) were carried out to obtain failure data of samples. Lognormal distribution function was applied to describe OLED life distribution, and the accelerated life equation was determined by Least square method (LSM). The Kolmogorov-Smirnov test was performed to verify whether the white OLED life meets lognormal distribution or not. Author-developed software was employed to predict the average life and the median life. The numerical results indicate that the white OLED life submits to lognormal distribution, and that the accelerated life equation meets inverse power law completely. The estimated life information of the white OLED provides manufacturers and customers with important guidelines.