Abstract
![CDATA[The microstructure evolution of graphite milled in n-dodecane and annealed at 1400 C in argon was investigated by Raman spectroscopy, near edge X-ray absorption fine structure (NEXAFS) spectroscopy and X-ray diffraction line broadening analysis (XRD). During milling, the n-dodecane molecular intercalation resulted in the increase in the interlayer spacing (d002). The intercalation facilitated graphite cleavage reducing the average crystallite thickness (Lc ) from 175 nm to 6 nm. The results of carbon X-edge NEXAFS spectroscopy indicated that the pi-electron system of graphite was disturbed during milling. Annealing increased the crystallite thickness to 10 nm, restored the pi-electron system of graphite but produced a number of coiled sheets These results provided strong evidence that the increased energy potential due to presence of local structure defects and modification of graphite pi-electron system provide the driving force for rolling up of thin graphite particles during annealing]]
| Original language | English |
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| Title of host publication | ICONN 2006: 2006 International Conference on Nanoscience and Nanotechnology, 3-7 July 2006, Brisbane, Australia |
| Publisher | IEEE |
| Number of pages | 4 |
| ISBN (Print) | 1424404533 |
| Publication status | Published - 2006 |
| Event | International Conference On Nanoscience and Nanotechnology - Duration: 1 Jan 2006 → … |
Conference
| Conference | International Conference On Nanoscience and Nanotechnology |
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| Period | 1/01/06 → … |
Keywords
- annealing of crystals
- graphite
- raman spectroscopy