Quantification of arsenic in activated carbon using particle induced X-ray emission

Nirbhay N. Yadav, Saravanamuthu Maheswaran, Vaithiyalingam Shutthanandan, Suntharampillai Thevuthasan, Huu-Hao Ngo, Saravanamuthu Vigneswaran

    Research output: Contribution to journalArticle

    Abstract

    To date, the trace elemental analysis of solids with inhomogeneous internal structure has been limited, particularly in the case of adsorbents. High-energy ion beam based particle induced X-ray emission (PIXE) is an ideal analytical tool suitable for simultaneous quantification of trace elements with high accuracy. In this study, PIXE was used to quantify arsenic in the adsorbents, granular activated carbon (GAC) and powder activated carbon (PAC). Pelletized and unmodified GAC and PAC samples were analyzed along with powder samples deposited on thin teflon filters. These sample preparation methods resulted in samples of various thicknesses and densities. PIXE measurements taken from these samples were compared to results from neutron activation analysis (NAA) and atomic absorption spectroscopy (AAS). There is a good agreement between the values from the NAA and pelletized PIXE measurements and some AAS measurements.
    Original languageEnglish
    Number of pages6
    JournalNuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms
    Publication statusPublished - 2006

    Keywords

    • AAS
    • NAA
    • PIXE
    • activated carbon
    • pelletization

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