TY - JOUR
T1 - Shortcomings in low-energy x-ray quantification using proportional counters in WDS
AU - Camus, Patrick
AU - Moran, Ken
AU - Matthews, Michael
AU - Wuhrer, Richard
PY - 2024/7/24
Y1 - 2024/7/24
N2 - Many analytical techniques have had mechanical, electronic, and algorithmic improvements since their introduction, which have led to increased analytical and quantitative performances. The EDS system has been improved by changing the front contact layer of the sensor for superior low-energy x-ray sensitivity, the technology to silicon-drift for increased speed of acquisition, and the window material from Beryllium for low-energy performance [1]. However, the EM Probe (EPMA) wavelength spectroscopy (WDS) has had few improvements with the proportional counter (PC) over the last 60 years, especially for low-energy x-rays (LEX).
AB - Many analytical techniques have had mechanical, electronic, and algorithmic improvements since their introduction, which have led to increased analytical and quantitative performances. The EDS system has been improved by changing the front contact layer of the sensor for superior low-energy x-ray sensitivity, the technology to silicon-drift for increased speed of acquisition, and the window material from Beryllium for low-energy performance [1]. However, the EM Probe (EPMA) wavelength spectroscopy (WDS) has had few improvements with the proportional counter (PC) over the last 60 years, especially for low-energy x-rays (LEX).
UR - http://www.scopus.com/inward/record.url?scp=85215702433&partnerID=8YFLogxK
U2 - 10.1093/mam/ozae044.090
DO - 10.1093/mam/ozae044.090
M3 - Article
AN - SCOPUS:85215702433
SN - 1431-9276
VL - 30
SP - 196
EP - 199
JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
JF - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
IS - Suppl. 1
ER -