Utilising the WDS-SD for obtaining better estimations of backgrounds and mass attenuation coefficients

Richard Wuhrer; Ken Moran; Michael Matthews

doi:10.1093/mam/ozae044.089

Utilising the WDS-SD for obtaining better estimations of backgrounds and mass attenuation coefficients

Richard Wuhrer, Ken Moran, Michael Matthews

Western Sydney University

Research output: Contribution to journal › Article › peer-review

Abstract

The replacing of the proportional counter (PC) detector in the wavelength dispersive spectrometer (WDS) with a silicon drift detector (SDD), referred to as WDS-SD, has many benefits [1-5] and resolves the many disadvantages and issues with a PC [1-6].

Original language	English
Pages (from-to)	191-195
Number of pages	5
Journal	Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada
Volume	30
Issue number	Suppl. 1
DOIs	https://doi.org/10.1093/mam/ozae044.089
Publication status	Published - 24 Jul 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024

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10.1093/mam/ozae044.089

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title = "Utilising the WDS-SD for obtaining better estimations of backgrounds and mass attenuation coefficients",

abstract = "The replacing of the proportional counter (PC) detector in the wavelength dispersive spectrometer (WDS) with a silicon drift detector (SDD), referred to as WDS-SD, has many benefits [1-5] and resolves the many disadvantages and issues with a PC [1-6].",

author = "Richard Wuhrer and Ken Moran and Michael Matthews",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.089",

language = "English",

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journal = "Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "Suppl. 1",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

}

Utilising the WDS-SD for obtaining better estimations of backgrounds and mass attenuation coefficients. / Wuhrer, Richard; Moran, Ken; Matthews, Michael.
In: Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada, Vol. 30, No. Suppl. 1, 24.07.2024, p. 191-195.

Research output: Contribution to journal › Article › peer-review

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T1 - Utilising the WDS-SD for obtaining better estimations of backgrounds and mass attenuation coefficients

AU - Wuhrer, Richard

AU - Moran, Ken

AU - Matthews, Michael

PY - 2024/7/24

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N2 - The replacing of the proportional counter (PC) detector in the wavelength dispersive spectrometer (WDS) with a silicon drift detector (SDD), referred to as WDS-SD, has many benefits [1-5] and resolves the many disadvantages and issues with a PC [1-6].

AB - The replacing of the proportional counter (PC) detector in the wavelength dispersive spectrometer (WDS) with a silicon drift detector (SDD), referred to as WDS-SD, has many benefits [1-5] and resolves the many disadvantages and issues with a PC [1-6].

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JO - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

JF - Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada

IS - Suppl. 1

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Utilising the WDS-SD for obtaining better estimations of backgrounds and mass attenuation coefficients

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