Original language | English |
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Pages (from-to) | 846-848 |
Number of pages | 3 |
Journal | Microscopy and Microanalysis |
Volume | 29 |
Issue number | 1 |
DOIs | |
Publication status | Published - 1 Aug 2023 |
WDS-SD : next generation of Wavelength Dispersive Spectrometers (WDS) with a Silicon Drift Detector (SDD) : what can it do, where are we now and where is it going?
Richard Wuhrer, K. Moran, M. Matthews
Research output: Contribution to journal › Article › peer-review