WDS-SD : next generation of Wavelength Dispersive Spectrometers (WDS) with a Silicon Drift Detector (SDD) : what can it do, where are we now and where is it going?

Richard Wuhrer, K. Moran, M. Matthews

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)
Original languageEnglish
Pages (from-to)846-848
Number of pages3
JournalMicroscopy and Microanalysis
Volume29
Issue number1
DOIs
Publication statusPublished - 1 Aug 2023

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