Abstract
Wavelength dispersive spectroscopy (WDS) is a very popular technique for trace element quantification. However, the EM Probe (EPMA) wavelength spectroscopy (WDS) has had few improvements in the detection system over the last 60 years, especially for low-energy x-rays (LEX) [1]. The WDS and the proportional counter (PC) used to measure the x-rays emitted from the samples has provided results that have contributed to significant findings.
| Original language | English |
|---|---|
| Pages (from-to) | 230-233 |
| Number of pages | 4 |
| Journal | Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada |
| Volume | 30 |
| Issue number | Supplement 1 |
| DOIs | |
| Publication status | Published - 24 Jul 2024 |
| Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024 |