White OLED Weibull life prediction using maximum likelihood estimation

Jian-ping Zhang; Jiong-lei Wu; Yu Liu; Helen Wu; Aixi Zhou; Wen-li Wu

doi:10.1520/JTE20120183

White OLED Weibull life prediction using maximum likelihood estimation

Jian-ping Zhang, Jiong-lei Wu, Yu Liu, Helen Wu, Aixi Zhou, Wen-li Wu

School of Engineering, Design & Built Environment

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter beta is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.

Original language	English
Pages (from-to)	76-80
Number of pages	5
Journal	Journal of Testing and Evaluation
Volume	41
Issue number	1
DOIs	https://doi.org/10.1520/JTE20120183
Publication status	Published - 2013

Keywords

Weibull distribution
life prediction
white OLED

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1520/JTE20120183

Cite this

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title = "White OLED Weibull life prediction using maximum likelihood estimation",

abstract = "A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter beta is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.",

keywords = "Weibull distribution, life prediction, white OLED",

author = "Jian-ping Zhang and Jiong-lei Wu and Yu Liu and Helen Wu and Aixi Zhou and Wen-li Wu",

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language = "English",

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TY - JOUR

T1 - White OLED Weibull life prediction using maximum likelihood estimation

AU - Zhang, Jian-ping

AU - Wu, Jiong-lei

AU - Liu, Yu

AU - Wu, Helen

AU - Zhou, Aixi

AU - Wu, Wen-li

PY - 2013

Y1 - 2013

N2 - A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter beta is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.

AB - A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter beta is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.

KW - Weibull distribution

KW - life prediction

KW - white OLED

UR - http://handle.uws.edu.au:8081/1959.7/524385

U2 - 10.1520/JTE20120183

DO - 10.1520/JTE20120183

M3 - Article

SN - 0090-3973

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SP - 76

EP - 80

JO - Journal of Testing and Evaluation

JF - Journal of Testing and Evaluation

IS - 1

ER -

White OLED Weibull life prediction using maximum likelihood estimation

Abstract

Keywords

UN SDGs

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