Abstract
Synchrotron light sources have provided highly versatile X ray sources for XRF mapping. The intensity, polarization and monochromatic nature provide several benefits for studying trace level elemental distributions in low Z materials such as biological samples. The greater intensity and collimation enable efficient focusing for small probing beam size. The polarization reduces detected scatter and the monochromatic incident beam reduces spectral background which improves signal to noise and detection limits. The ability to tune the incident energy also allows for easy distinction of elements with overlapping emission lines by selectively determining which elements are excited while omitting others. This can also be utilized to further optimize detection limits or conduct X ray absorption spectroscopy.
Original language | English |
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Pages (from-to) | 12-16 |
Number of pages | 5 |
Journal | XRF Newsletter |
Volume | 24 |
Publication status | Published - 2013 |