Quantification of trace metals in an adsorbent using proton induced x-ray emission

Abstract

High-energy ion beam based proton induced x-ray (PIXE) is an ideal analytical tool suitable for simultaneous quantification of trace elements with high accuracy. The quantification of trace elements in solids using PIXE has been well established for over two decades. The main objective of this study is to extend this capability to solids with an inhomogeneous internal structure. In this study, pure GAC and PAC samples were soaked in known concentration of arsenic (As) solution and the trace amount of As uptake was determined during these exposures using PIXE, neutron activation analysis (NAA) and atomic absorption spectroscopy (AAS). There is a good agreement between the values and adsorption mechanisms derived from the NAA and pelletised PIXE measurements and some AAS measurements. Micro-PIXE was used to understand the discrepancies in the As adsorption on the pore and flat surfaces of GAC samples.

Date of Award	2005
Original language	English